Showing results: 481 - 495 of 608 items found.
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ACMAS Technologies Pvt. Ltd.
The Ultra Low Temperature Test Chamber from Weiber are specially designed equipments that provide specific low temperature environments for testing a wide variety of products and their performance under non-ambient testing conditions. They are engineered and configured to meet the exacting low temperature requirements of various research applications and often find their use for evaluation of material properties at extreme temperatures. These versatile test chambers offer the capabilities of measuring temperature extremes, allowing both freeze tolerance studies as well as the effect of heat stress on the sample specimen within the same equipment. They combine advanced technological features with an energy efficient design for highly accurate test conditions and repeatability of results. These test chambers provide a cost-effective solution to expensive laboratory tests and are available at economical prices for increased affordability. They are designed for safe and reliable operation and find widespread usage in chemical and pharmaceutical industries, biotechnology and medicine industry, petroleum industry, food industries and other industrial and manufacturing units.
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BXL Series -
IBEKO Power AB
BXL is an extra load unit designed to be used with DV Power’s BLU series battery testers. However, this unit is a universal add-on device. Because of that, it is compatible, as an additional load, with any other discharge/capacity tester in the market.In case when discharge current exceeds the capacity of a single BLU device, BXL can increase the discharge capacity. There are no limitations on the number of extra load units that can be connected in parallel to the main battery tester.A system of BLU and BXL instruments enables performing the capacity test in an accurate, user-friendly way. Also, all instruments are in accordance with battery testing standards: IEEE 450-2010, IEEE 1188-2005, IEEE 1106-2015, IEC 60896-11/22, and other relevant standards.These units can be used on any type of battery string, such as lead-acid, Li-Ion, Ni-Cd, etc. They test battery strings with voltages in the range of 5,25 – 500 V DC. On the other hand, current up to 250 A can be discharged through the BXL internal structure.The instrument simulates a constant resistance load during the discharge test. Several resistances can be set for different battery nominal voltage levels. This makes BXL extremely flexible in selecting its load capabilities.
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Intepro Systems
The Procyon PTS 2100-10 is a configurable turnkey Power Test System, delivering automated test equipment (ATE) to some of the world’s largest-volume manufacturers as well as the affordability needed by niche market producers. Aerospace, defense, and avionics power supply ATE test systems applications include functional testing of AC and DC power supplies, generator, and engine control units, as well as a wide range of associated electronics.
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DYNA4 Framework -
TESIS DYNAware Technische Simulation Dynamischer Systeme GmbH
DYNA4 is a modular simulation software for efficient work with simulation models in the automotive development process, e. g. of electronic control units and components. Model-based design, function development. Testing and pre-calibration in SIL and HIL environments. Fail-safe and functional tests, including evaluation of vehicle response and drivability. Advanced powertrain development and energy management. Fuel efficiency simulation for hybrid (HEV), electric (EV) or traditional vehicles.
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TTC/CTC -
Memmert GmbH + Co.KG
Rapid, precise and energy-saving temperature changes in the range from -42 C to +190 C, along with fast humidity recovery times, make the TTC temperature test chamber and the CTC climatic test chamber with humidity unit a perfect duo for controlled material testing, function tests, ageing tests or climate tests on composites, concrete, plastics or electronic components in material technology, the automotive and aerospace industries, and electronics.
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InGyro Test Module -
Cohu, Inc.
The InGyro sensor test module and functional test program for physical stimulation of inertial sensors under temperature conditions supports multiple target applications: accelerometers, gyroscopes, as well as multi-axis IMU’s (inertial measurement units) up to 9DOF (Degrees of Freedom). To meet the requirements of automotive and other demanding applications the temperature range the InGyro module supports testing at temperatures from -40°C to +125°C.
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DAS-429UNET/RTx -
Excalibur Systems, Inc.
Our DAS-429UNET/RTx is an intelligent, multichannel ARINC 429 interface device that can be connected to any Windows device with a USB or Ethernet connector. It monitors and records all or selected 429 traffic for later analysis or reconstruction in the lab. Exalt is our Windows base graphical tool that allows you to analyze real time or recorded data using many different views: raw data, engineering units or graphical displays.Data can be then extracted from the recorded file, and re-transmitted over the bus to another system in order to see in detail what happened during the recorded test.The combination of a handheld computer, 429Unet card and Exalt provides a complete solution for testing and maintaining ARINC-429 networks.
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Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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ACMAS Technologies Pvt. Ltd.
The high low temperature test chambers from Weiber are climatic test chambers, designed to simulate highly precise high and low temperature environments for the testing of electrical and electronics items, metallic products, automobile parts, food items, biological samples, chemicals, building materials and other wide variety of processed and packaged goods. These test chambers find widespread usage in manufacturing units, quality control units and scientific research organizations and are commonly employed for heat endurance test, cold endurance test and humidity and dryness endurance tests of products. These tests help in determining the product performance in specific environments and also help in identifying any manufacturing flaws and in determining its stability and shelf life.
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Keighley Laboratories LTD
NDT covers a wide group of testing techniques used to evaluate the properties of a material, part, product, weld or system without causing damage. NDT carried out at KLL includes:Liquid Penetrant Testing (LPT) is used for the detection of surface breaking discontinuities on magnetic and non-magnetic metallic materials.Fluorescent and colour contrast penetrants are available to be used in the following methods:-Water washableSolvent removablePost emulsifiableMagnetic Particle Inspection (MT/MPI) is used for the detection of surface breaking and slightly sub-surface (up to 2mm) discontinuities.Bench type crack detectors and portable units are employed producing various waveforms (i.e. A.C, HWDC and induced magnetic flow) to give both circular and longitudinal magnetism.On-site testing is carried out using electro magnetic yokes and permanent magnets producing induced magnetic flow.Ultrasonic Flaw Detection (UT), also known as Ultrasonic Inspection, is used for the detection of volumetric discontinuities in ferrous and non-ferrous products (forgings and castings etc.), and welds in magnetic and non-magnetic materials.UT is capable of penetrating metals, dependent on the material characteristics, up to 10m in length.Some thickness and depth checks can also be carried out using ultrasound.Radiography services are available through sub-contract booked in advance. Notice is required for on-site work.Personnel are available at short notice for in-house or on-site work in the UK and overseas.All inspectors undertaking non destructive testing (LPT, MT/MPI and UT) are qualified to, and meet a minimum of, PCN Level 2.PCN Level 3 supervision is available in-house for LPT, MT/MPI, UT offering consultancy services including procedure writing and commentary, auditing of techniques and Level 3 Supervisor cover.We can assist clients in product qualification, material testing, quality assurance and audit programmes.
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FOX-1P -
Aehr Test Systems
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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HDPMU -
Salland Engineering
Today cost efficiency is more important than ever. Many manufacturers are working on maximizing multi-site testing. Often maximization can’t be done because of limited tester resources. Salland’s HDPMU gives you up to 192 additional independent parametric measurement units (PMU) channels on a single board. Our solution will increase parallel testing without the need for creating complex device interface board (DIB). It can be used for continuity, functional or parametric tests or simply for device setup or loading. Full integration with the Teradyne IG-XL™ Software, easy set-up and high parallel measurement capability will reduce test costs significantly.
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FOX-XP -
Aehr Test Systems
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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1659 -
IET Labs
The GenRad 1659 Digibridge RLC Tester is an easily programmable, microprocessor-based high performance passive component tester. It automatically identifies the type of component under test and measures in the proper range. The result is simple, precise, unambiguous RLC component testing. The GenRad 1659 RLC Digibridge is an instrument for measuring primary parameters of inductance (L), capacitance (C) and resistance (R) and secondary parameters of dissipation factor (D) and quality factor (Q). GenRad designed this single compact unit with maximum flexibility and operator convenience in mind. The simple front panel design of the Digibridge requires less effort to operate. Digital display and user friendly control allows test parameters and limits to be set easily.
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NX5000 Series -
Marvin Test Solutions, Inc.
ROM emulation is a powerful and versatile method of microprocessor testing. ROM emulation has emerged as the technique of choice for microprocessor test and diagnostic applications. A microprocessor-based board is tested by replacing the boot ROMs on the Unit Under Test (UUT) with memory emulation pods. Each pod handles eight bits of the data bus. Processors from 8 to 32 bits can be controlled with one to four pods (even the most advanced CPUs such as the Intel Pentium generally use only an eight-bit boot path). The emulator takes control of the UUT by resetting the processor and, under the test program’s control (monitor program), exercises all functions on the board. Synchronization with the UUT is automatic and requires no additional hardware or connections.
